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Volumn , Issue , 2006, Pages 1175-1177

New generation streak camera design and investigation

Author keywords

[No Author keywords available]

Indexed keywords

PARTICLE BEAM BUNCHING; SURFACE ROUGHNESS;

EID: 84898793485     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (4)

References (7)
  • 1
    • 0345283184 scopus 로고    scopus 로고
    • New principles in photochronography of femtosecond resolution
    • A.M. Tron, "New principles in photochronography of femtosecond resolution", Proc. of SPIE 4948 (2003) 141.
    • (2003) Proc. of SPIE , vol.4948 , pp. 141
    • Tron, A.M.1
  • 2
    • 0033347341 scopus 로고    scopus 로고
    • Limitations at short bunch length monitoring
    • New York, USA.
    • A.M. Tron, "Limitations at Short Bunch length Monitoring", Proc. of the PAC99 Conf., New York, USA. 1999. p. 2190.
    • (1999) Proc. of the PAC99 Conf. , pp. 2190
    • Tron, A.M.1
  • 5
    • 84879979072 scopus 로고    scopus 로고
    • Method of bunch radiation photochronography with 10 femtosecond and less resolution
    • Arice, Italy, Octhorber
    • A.M. Tron, I.G. Merinov, "Method of bunch radiation photochronography with 10 femtosecond and less resolution", Proc. of the PAHBEB2005 Conf., Arice, Italy, Octhorber 2005. http://www.physics.ucla.edu/ PAHBEB2005/talks/10-oct-2005/wg-2/a-tron.pdf
    • (2005) Proc. of the PAHBEB2005 Conf.
    • Tron, A.M.1    Merinov, I.G.2
  • 6
    • 23244439791 scopus 로고    scopus 로고
    • Klystron-type photoelectron gun design for femtosecond electron diffractometer
    • A.M. Tron, I.G. Merinov, "Klystron-type photoelectron gun design for femtosecond electron diffractometer'. Proc. of SPIE 5580 (2005) 700.
    • (2005) Proc. of SPIE , vol.5580 , pp. 700
    • Tron, A.M.1    Merinov, I.G.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.