Real time detection of the epitaxial growth of oligothiophene layers by reflectance anisotropy spectroscopy

Surface Science

Volumn 601, Issue 18, 2007, Pages 4488-4491

  Bussetti, G ^a   Goletti, C ^a   Chiaradia, P ^a   Sassella, A ^b   Campione, M ^b   Tavazzi, S ^b   Borghesi, A ^b  

^a UNIVERSITY OF ROME TOR VERGATA   (Italy)

^b UNIVERSITY OF MILANO BICOCCA   (Italy)

Author keywords

In situ characterization; Molecular beam epitaxy; Organic heterojunction; Organic thin films; Reflectance anisotropy spectroscopy; Thin film structure

Indexed keywords

HETEROJUNCTIONS; MAGNETIC ANISOTROPY; MOLECULAR BEAM EPITAXY; MULTILAYERS; REFLECTION; SINGLE CRYSTALS; SPECTROSCOPIC ANALYSIS;

IN SITU CHARACTERIZATION; ORGANIC HETEROJUNCTIONS; ORGANIC THIN FILMS; REFLECTANCE ANISOTROPY SPECTROSCOPY; SEXITHIOPHENE;

BENZENE;

EID: 34548610674     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2007.04.241     Document Type: Article

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