Epitaxial growth of organic heterostructures: Morphology, structure, and growth mode

Surface Science

Volumn 601, Issue 13, 2007, Pages 2571-2575

  Sassella, A ^a   Campione, M ^a   Raimondo, L ^a   Tavazzi, S ^a   Borghesi, A ^a   Goletti, C ^b   Bussetti, G ^b   Chiaradia, P ^b  

^a UNIVERSITY OF MILANO BICOCCA   (Italy)

^b UNIVERSITY OF ROME TOR VERGATA   (Italy)

Author keywords

Atomic force microscopy; In situ characterization; Molecular beam epitaxy; Semiconductor semiconductor thin film structures; Surface structure, morphology, roughness, and topography; Thin film structures

Indexed keywords

ATOMIC FORCE MICROSCOPY; EPITAXIAL GROWTH; MOLECULAR BEAM EPITAXY; SINGLE CRYSTALS; THICK FILMS;

IN SITU CHARACTERIZATION; THIN FILM STRUCTURES;

HETEROJUNCTION BIPOLAR TRANSISTORS;

EID: 34250753767     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2006.11.072     Document Type: Article

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