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Volumn 39, Issue 31, 2000, Pages 5820-5826

Analysis of reflectometers for surface anisotropy

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT MODULATORS; LIGHT REFLECTION; LIGHT SCATTERING; REFLECTOMETERS;

EID: 0001228055     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.39.005820     Document Type: Article
Times cited : (40)

References (19)
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  • 2
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    • (1993) Physical Methods of Chemistry
    • Ho, W.1
  • 6
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    • Generalized ellipsometry and complex optical systems
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    • Schubert, M.1
  • 9
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    • Anisotropies in the above-band-gap optical spectra of cubic semiconductors
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  • 11
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    • Optical spectroscopy of (110) surfaces of III-V semiconductors
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    • Berkovits, V.L.1    Kiselev, V.A.2    Safarov, V.I.3
  • 12
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    • Application of reflectance difference spectroscopy to molecular-beam-epitaxy growth of GaAs and AlAs
    • D. E. Aspnes, J. P. Harbison, A. A. Studna, and L. T. Florez, “Application of reflectance difference spectroscopy to molecular-beam-epitaxy growth of GaAs and AlAs,” J. Vac. Sci. Technol. A 6, 1327-1332 (1988).
    • (1988) J. Vac. Sci. Technol. A , vol.6 , pp. 1327-1332
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  • 13
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    • Piezo-optical birefringence modulators: New use for a long-known effect
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  • 14
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  • 15
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  • 16
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  • 17
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.