Determination of thin film optical parameters from photometric measurements: An algebraic solution for the (trfrb) method

Applied Optics

Volumn 30, Issue 19, 1991, Pages 2795-2800

  Konstantinov, Ivan ^a  

^a CENTRAL LABORATORY OF PHOTOPROCESSES   (Bulgaria)

Author keywords

Algebraic technique; Determination methods; Optical constants; Photometric measurements; Thin films

Indexed keywords

EID: 84975649447     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.30.002795     Document Type: Article

References (12)

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