Chemical modification of semiconductor surfaces by means of nanometric cellulose films

Journal of Physical Chemistry C

Volumn 111, Issue 34, 2007, Pages 12792-12803

  Vilar, Manuel R ^a   Boufi, Sami ^b   Ferraria, Ana Maria ^c   Do Rego, Ana Maria Botelho ^c  

^a UNIVERSITÉ PARIS DESCARTES   (France)

^b Faculté des Sciences de Sfax   (Tunisia)

^c UNIVERSITY OF LISBON   (Portugal)

Author keywords

[No Author keywords available]

Indexed keywords

CELLULOSE; ELECTRON ENERGY LOSS SPECTROSCOPY; FILM THICKNESS; HYDROCHLORIC ACID; MOLECULAR INTERACTIONS; SEMICONDUCTOR MATERIALS; SURFACE CHEMISTRY; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

FUNCTIONALIZATION; PHENYL ISOCYANATE;

SURFACES;

CELLULOSE FILM; SEMICONDUCTORS; SURFACES;

EID: 34548588512     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp073850a     Document Type: Article

References (32)

1. Brodsky, M. H. Sci. Am. 1990, 262 (2), 68-75.
2. Ashkenasy. G.; Cahen. D.; Cohen. R.; Shanzer, A.; Vilan, A. Acc. Chem. Res. 2002, 35, 121-128.
3. Rei Vilar, M.; El Beghdadi, J.; Debontridder, F.; Naaman, R.; Arbel, A.; Ferraria, A. M.; Botelho do Rego. A. M. Mater. Sci. Eng., C 2005, 26, 253-259.
4. Harrick, N. J. Internal Reflection Spectroscopy; Interscience Publishers, John Wiley & Sons: New York, 1967.
5. Schempp, W.; Krause, T.; Seifried, U.; Koura. A. Das Papier 1984, 38, 607-610.
6. Schaub, M.; Wenz, G.; Wegner, G. Adv. Mater. 1993, 5, 919-922.
7. Buchholz, V.; Wegner, G.; Stemme, S.; Ödberg, L. Adv. Mater. 1996, 8, 399-402.
8. Kontturi, E.; Thune, P. C.; Niemantsverdiriet, J. W. Polymer 2003, 44, 3621-3625.
9. Kontturi, E.; Thune, P. C.; Alexeev. A.; Niemantsverdiriet, J. W. Polymer 2005, 46, 3307-3317.
10. Rojas, O. J.; Ernstsson, M.; Neuman, R. D.; Claesson, P. M. J. Phys. Chem B 2000, 104 (43), 10032-10042.
11. Österberg, M. J. Colloid Interface Sci. 2000, 229, 620-627.
12. Botaro, V. R.; Gandini, A. Cellulose 1998, 5, 65-78.
13. Williamson, S. L.; McCormick, C. L. J. Macromol. Sci., Part A: Pure Appl. Chem. 1998, 35, 1995-1927.
14. Gandini A.; Botaro V.; Zeno E.; Bach S. Polym. Int. 2001, 50, 7-9.
15. Heinze, T.; Liebert, T. Prog. Polym. Sci. 2001, 26, 1689-1762.
16. Rei Vilar, M.; El Beghdadi, J.; Debontridder, F.; Artzi, R.; Naaman, R.; Ferraria, A. M.; Botelho do Rego. A. M. Surf. Interface Anal. 2005, 37, 673-682.
17. Wagner, C. D.; Naumkin, A. V.; Kraut-Vass, A.; Allison, J. W.; Powell, C. J.; Rumble, J. R., Jr. NIST X-ray Photoelectron Spectroscopy Database, NIST Standard Reference Database 20, Version 3.4 (Web Version), http://srdata.nist. gov/xps/, 2003.
18. Beamson, G.; Briggs, D. High Resolution XPS of Organic Polymers. The Scienta ESCA300 Database; John Wiley & Sons: New York, 1992.
19. Rei Vilar, M.; Botelho do Rego, A. M.; Lopes da Silva, J.; Abel, F.; Schott, M.; Quillet, V.; Petitjean, S.; Jérôme, R. Macromolecules 1994, 27, (20), 5900-5906.
20. Tsuboi, M. J. Polym. Sci. 1957, 25, 159-171.
21. Zhbankov, R. G.; Firsov, S. P.; Buslov, D. K.; Nikonenko, N. A.; Marshewka, M. K.; Ratajczak, H. J. Mol. Struct. 2002, 614, 117-125.
22. Carrillo, F.; Clom, X.; Suñol, J. J.; Saurina, J. Eur. Polym. J. 2004, 40, 2229-2234.
23. Socrates, G. Infrared Characteristic Group Frequencies, 2nd ed.; Wiley International Publication; John Wiley & Sons: Chichester, U.K., 1994.
24. Colom, X.; Carrillo, F. Eur. Polym. J. 2002, 38, 2225-2230.
25. See for instance, Botelho do Rego, A. M.; Rei Vilar, M.; Lopes da Silva, J. J. Electron Spedrosc. Relat. Phenom. 1997, 85, 81-91.
26. Dubois, L. H.; Schwartz, G. P. J. Electron Spedrosc. Relat. Phenom. 1983, 29, 175-180.
27. McCowan C. S.; Caudle M. T. Dalton Trans. 2005, (2), 238-246.
28. Cheremisinoff, N. P. Handbook of Polymer Science and Technology; Marcel Dekker: New York, 1989.
29. Caraculacu, A. A.; Coseri, S. Prog. Polym. Sci. 2001, 26, 799-851.
30. Zhao, C. G.; Ji, L. J.; Liu, H. J.; Hu, G. J.; Zhang, S. M.; Yang, M. S.; Yang, Z. Z., J. Solid State Chem. 2004, 177, 4394-4398.
31. Angellier, H.; Molina-Boisseau, S.; Belgacem, M. N.; Dufresne, A. Langmuir 2005, 21, 2425-2433.
32. Botelho do Rego, A. M.; Ferraria, A. M.; El Beghdadi, J.; Debontridder, F.; Brogueira, P.; Naaman, R.; Rei Vilar, M. Langmuir 2005, 21, 8765-8773.