-
1
-
-
0034228257
-
-
Seker, F.; Meeker, K.; Kuech, T.; Ellis, A. B. Chem. Rev. 2000, 100, 2505.
-
(2000)
Chem. Rev.
, vol.100
, pp. 2505
-
-
Seker, F.1
Meeker, K.2
Kuech, T.3
Ellis, A.B.4
-
2
-
-
0008965803
-
-
Brodsky, M. H. Sci. Am. 1990, 262 (2), 68.
-
(1990)
Sci. Am.
, vol.262
, Issue.2
, pp. 68
-
-
Brodsky, M.H.1
-
3
-
-
0036180508
-
-
Ashkenasy, G.; Cahen, D.; Cohen, R.; Shanzer, A.; Vilan, A. Acc. Chem. Res. 2002, 35, 121.
-
(2002)
Acc. Chem. Res.
, vol.35
, pp. 121
-
-
Ashkenasy, G.1
Cahen, D.2
Cohen, R.3
Shanzer, A.4
Vilan, A.5
-
6
-
-
0031245965
-
-
To, X. H.; Pebere, N.; Pelabrat, N.; Boutevin, B.; Hervaud, Y. Corros. Sci. 1997, 10-11, 1925.
-
(1997)
Corros. Sci.
, vol.10-11
, pp. 1925
-
-
To, X.H.1
Pebere, N.2
Pelabrat, N.3
Boutevin, B.4
Hervaud, Y.5
-
7
-
-
0035368326
-
-
Kim, C. S.; Lad, R. J.; Tripp, C. P. Sens. Actuators, B 2001, 76, 442.
-
(2001)
Sens. Actuators, B
, vol.76
, pp. 442
-
-
Kim, C.S.1
Lad, R.J.2
Tripp, C.P.3
-
8
-
-
0037416867
-
-
Schwartz, J.; Avaltroni, M. J.; Dnahy, M. P.; Silverman, B. M.; Hanson, E. L.; Schwarzbauer, J. E.; Midwood, K. S.; Gawalt, E. S. Mater. Sci. Eng., C 2003, 23, 395.
-
(2003)
Mater. Sci. Eng., C
, vol.23
, pp. 395
-
-
Schwartz, J.1
Avaltroni, M.J.2
Dnahy, M.P.3
Silverman, B.M.4
Hanson, E.L.5
Schwarzbauer, J.E.6
Midwood, K.S.7
Gawalt, E.S.8
-
9
-
-
0141718811
-
-
Artzi, R.; Daube, S.; Cohen H.; Naaman, R. Langmuir 2003, 19, 7392.
-
(2003)
Langmuir
, vol.19
, pp. 7392
-
-
Artzi, R.1
Daube, S.2
Cohen, H.3
Naaman, R.4
-
10
-
-
23444461622
-
-
Rei Vilar, M.; El Beghdadi, J.; Debontridder, F.; Naaman, R.; Ferraria, A. M.; Botelho do Rego, A. M. Surf. Interface Anal. 2005, 37, 673.
-
(2005)
Surf. Interface Anal.
, vol.37
, pp. 673
-
-
Rei Vilar, M.1
El Beghdadi, J.2
Debontridder, F.3
Naaman, R.4
Ferraria, A.M.5
Botelho Do Rego, A.M.6
-
12
-
-
0003715129
-
-
NIST Standard Reference Database 20, Version 3.4 (web version); (accessed 2003)
-
Wagner G. D.; Naumkin, A. V.; Kraut-Vass, A.; Allison, J. W.; Powell, C. J.; Rumble, J. R., Jr. NIST X-ray Photoelectron Spectroscopy Database; NIST Standard Reference Database 20, Version 3.4 (web version); http://srdata.nist. gov/xps/ (accessed 2003).
-
NIST X-ray Photoelectron Spectroscopy Database
-
-
Wagner, G.D.1
Naumkin, A.V.2
Kraut-Vass, A.3
Allison, J.W.4
Powell, C.J.5
Rumble Jr., J.R.6
-
14
-
-
0028497558
-
-
Rei Vilar, M.; Botelho do Rego, A. M.; Lopes da Silva, J.; Abel, F.; Schott, M.; Quillet, V.; Petitjean, S.; Jérôme, R. Macromolecules 1994, 27, 5900.
-
(1994)
Macromolecules
, vol.27
, pp. 5900
-
-
Rei Vilar, M.1
Botelho Do Rego, A.M.2
Lopes Da Silva, J.3
Abel, F.4
Schott, M.5
Quillet, V.6
Petitjean, S.7
Jérôme, R.8
-
17
-
-
4644345554
-
-
Ohno, K.; Mandai, Y.; Matsuura, H. J. Mol. Struct. 1993, 298, 1.
-
(1993)
J. Mol. Struct.
, vol.298
, pp. 1
-
-
Ohno, K.1
Mandai, Y.2
Matsuura, H.3
-
20
-
-
0038644255
-
-
Buckenmaier, S. M. C.; McCalley, D. V.; Euerby, M. R. J. Chromatogr., A 2003, 1004, 71.
-
(2003)
J. Chromatogr., A
, vol.1004
, pp. 71
-
-
Buckenmaier, S.M.C.1
McCalley, D.V.2
Euerby, M.R.3
-
21
-
-
0344672453
-
-
Barja, B. C.; Tejedor-Tejedor, M. I.; Anderson, M. A. Langmuir 1999, 15, 2316.
-
(1999)
Langmuir
, vol.15
, pp. 2316
-
-
Barja, B.C.1
Tejedor-Tejedor, M.I.2
Anderson, M.A.3
-
23
-
-
0036540215
-
-
Kirchner, C.; George, M.; Stein, B.; Parak, W. J.; Gaub, H. E.; Seitz, M. Adv. Funct. Mater. 2002, 12 (4), 266.
-
(2002)
Adv. Funct. Mater.
, vol.12
, Issue.4
, pp. 266
-
-
Kirchner, C.1
George, M.2
Stein, B.3
Parak, W.J.4
Gaub, H.E.5
Seitz, M.6
-
24
-
-
0038876375
-
-
Mizokawa, Y.; Iwasaki, H.; Nishitani, R.; Nakamura, S. J. Electron Spectrosc. Relat. Phenom. 1978, 14, 129.
-
(1978)
J. Electron Spectrosc. Relat. Phenom.
, vol.14
, pp. 129
-
-
Mizokawa, Y.1
Iwasaki, H.2
Nishitani, R.3
Nakamura, S.4
-
25
-
-
0028387002
-
-
Tanuma, S.; Powell, C. J.; Penn, D. R. Surf. Interface Anal. 1994, 21, 165-176.
-
(1994)
Surf. Interface Anal.
, vol.21
, pp. 165-176
-
-
Tanuma, S.1
Powell, C.J.2
Penn, D.R.3
-
30
-
-
0000086161
-
-
Rei Vilar, M.; Horowitz, G.; Lang, P.; Pellegrino, O.; Botelho do Rego, A. M. Adv. Mater. Opt. Electron. 1999, 9, 211.
-
(1999)
Adv. Mater. Opt. Electron.
, vol.9
, pp. 211
-
-
Rei Vilar, M.1
Horowitz, G.2
Lang, P.3
Pellegrino, O.4
Botelho Do Rego, A.M.5
-
31
-
-
25844466001
-
-
Freiberger Compound Materials GmbH: Freiberg, Germany
-
Freiberger General Specifications; Freiberger Compound Materials GmbH: Freiberg, Germany, 2000.
-
(2000)
Freiberger General Specifications
-
-
-
32
-
-
0035936212
-
-
Clancy, T. C.; Jang, J. H.; Dhinojwala, A.; Mattice, W. L. J. Phys. Chem. B 2001, 105 (46), 11493.
-
(2001)
J. Phys. Chem. B
, vol.105
, Issue.46
, pp. 11493
-
-
Clancy, T.C.1
Jang, J.H.2
Dhinojwala, A.3
Mattice, W.L.4
-
33
-
-
0036925723
-
-
Pellegrino, O.; Rei Vilar, M.; Horowitz, G.; Botelho do Rego, A. M. Mater. Sci. Eng. 2002, C22, 367.
-
(2002)
Mater. Sci. Eng.
, vol.C22
, pp. 367
-
-
Pellegrino, O.1
Rei Vilar, M.2
Horowitz, G.3
Botelho Do Rego, A.M.4
|