Introducing open films of nanosized cellulose - Atomic force microscopy and quantification of morphology

Polymer

Volumn 46, Issue 10, 2005, Pages 3307-3317

  Kontturi, E ^a   Thune P C ^a   Alexeev, A ^a   Niemantsverdriet, J W ^a  

^a EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

Atomic force microscopy; Cellulose model surface; Open film

Indexed keywords

ATOMIC FORCE MICROSCOPY; HYDROLYSIS; IMAGE PROCESSING; MOLECULAR STRUCTURE; MORPHOLOGY; SILICON; WETTING;

ATOMIC FORCE MICROSCOPY (AFM) HEIGHT IMAGES; MOLECULAR ARCHITECTURES; TRIMETHYLSILYL CELLULOSE (TMSC); VAPOR PHASE ACID HYDROLYSIS;

CELLULOSE FILMS;

ANATOMY; CELLULOSE FILM; DRYING; HYDROLYSIS; MOLECULAR STRUCTURE; SILICON; WETTING;

FILM;

EID: 16244384680     PISSN: 00323861     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.polymer.2005.02.087     Document Type: Article

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