Methods for obtaining the strain-free lattice parameter when using diffraction to determine residual stress

Journal of Applied Crystallography

Volumn 40, Issue 5, 2007, Pages 891-904

  Withers, P J ^a   Preuss, M ^a   Steuwer, A ^b   Pang, J W L ^c  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^c OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

Neutron diffraction; Residual stress; Strain free lattice spacing; Synchrotron X rays

Indexed keywords

EID: 34548546448     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889807030269     Document Type: Article

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