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Journal of Applied Crystallography

Volumn 35, Issue 4, 2002, Pages 497-504

Mapping of unstressed lattice parameters using pulsed neutron transmission diffraction

(5) Santisteban, Javier Roberto a Steuwer, A a Edwards, L a Withers, P J a Fitzpatrick, M E a

a OPEN UNIVERSITY (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTIC METHOD; ARTICLE; IMAGE DISPLAY; MEASUREMENT; NEUTRON; STANDARDIZATION; X RAY DIFFRACTION;

RESEDA LUTEOLA;

EID: 0036347203 PISSN: 00218898 EISSN: None Source Type: Journal
DOI: 10.1107/S0021889802009044 Document Type: Article

Times cited : (26)

References (19)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.