Temperature dependence of dielectric properties for Ba(Zr0.25Ti0.75)O3 thin films obtained from the soft chemical method

Materials Chemistry and Physics

Volumn 105, Issue 2-3, 2007, Pages 293-297

  Marques, L G A ^a   Cavalcante, L S ^a,b   Simoes A Z ^c   Pontes, F M ^c   Santos Junior L S ^a   Santos, M R M C ^a   Rosa, I L V ^b   Varela, J A ^c   Longo, E ^c  

^a FEDERAL UNIVERSITY OF PIAUÍ   (Brazil)

^b FEDERAL UNIVERSITY OF SÃO CARLOS   (Brazil)

^c SÃO PAULO STATE UNIVERSITY UNESP   (Brazil)

Author keywords

BZT; Dielectric properties; Temperature dependence; Thin films

Indexed keywords

BARIUM COMPOUNDS; CRYSTALLIZATION; MICROSTRUCTURE; PERMITTIVITY; PEROVSKITE; THERMAL EFFECTS;

POLYMERIC PRECURSOR METHOD (PPM); SOFT CHEMICAL METHOD; TEMPERATURE DEPENDENCE;

THIN FILMS;

EID: 34548501322     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchemphys.2007.04.065     Document Type: Article

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