Investigations on the infrared optical properties of BaTiO3 ferroelectric thin films by spectroscopic ellipsometry

Semiconductor Science and Technology

Volumn 18, Issue 6, 2003, Pages 449-453

  Hu, Zhigao ^a   Wang, Genshui ^a   Huang, Zhiming ^a   Meng, Xiangjian ^a   Chu, Junhao ^a  

^a SHANGHAI INSTITUTE OF TECHNICAL PHYSICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

BARIUM TITANATE; ELLIPSOMETRY; FILM GROWTH; INFRARED SPECTROSCOPY; LIGHT ABSORPTION; MULTILAYERS; POLYCRYSTALLINE MATERIALS; REFRACTIVE INDEX; SOL-GELS; X RAY DIFFRACTION ANALYSIS;

INFRARED ABSORPTION;

FERROELECTRIC THIN FILMS;

EID: 0037833398     PISSN: 02681242     EISSN: None     Source Type: Journal    
DOI: 10.1088/0268-1242/18/6/310     Document Type: Article

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