Influence of random roughness on the adhesion between metal surfaces due to capillary condensation

Applied Physics Letters

Volumn 91, Issue 10, 2007, Pages

  Van Zwol, P J ^a   Palasantzas, G ^a   De Hosson, J Th M ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; CAPILLARITY; CONDENSATION; ELECTROSTATIC FORCE; METALS; VAN DER WAALS FORCES;

ADHESIVE FORCES; CAPILLARY CONDENSATION; CONTACT SURFACES; GOLD SURFACES;

SURFACE ROUGHNESS;

EID: 34548498347     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2768919     Document Type: Article

References (17)

1. J. Israelachvili, Intermolecular and Surface Forces (Academic, New York, 1992), Vol. 2, p. 330.
2. A. W. Adamson and A. P. Gast, Physical Chemistry of Surfaces (Wiley, New York, 1997), Vol. 6, p. 599.
3. C. H. Mastrangelo and C. H. Hsu, J. Microelectromech. Syst. 2, 33 (1993).
4. C. H. Mastrangelo and C. H. Hsu, J. Microelectromech. Syst. 2, 44 (1993).
5. T. Abe and M. L. Reed, J. Micromech. Microeng. 6, 213 (1996).
6. K. L. Ekinci and M. L. Roukes, Rev. Sci. Instrum. 76, 061101 (2005).
7. A. Cleland, Foundations of Nanomechanics (Springer, New York, 2003).
8. G. Palasantzas, J. Appl. Phys. 0021-8979 10.1063/1.1935127 97, 126104 (2005); G. Palasantzas and J. Th. M. De Hosson, Phys. Rev. B 0163-1829 10.1103/PhysRevB.72.115426 72, 115426 (2005); G. Palasantzas and J. Th. M. De Hosson, Phys. Rev. B 0163-1829 10.1103/PhysRevB.72.121409 72, 121409 (2005); G. Palasantzas and J. Th. M. De Hosson, Surf. Sci. 600, 1450 (2006).
9. G. Palasantzas, J. Appl. Phys. 0021-8979 10.1063/1.1935127 97, 126104 (2005); G. Palasantzas and J. Th. M. De Hosson, Phys. Rev. B 0163-1829 10.1103/PhysRevB.72.115426 72, 115426 (2005); G. Palasantzas and J. Th. M. De Hosson, Phys. Rev. B 0163-1829 10.1103/PhysRevB.72.121409 72, 121409 (2005); G. Palasantzas and J. Th. M. De Hosson, Surf. Sci. 600, 1450 (2006).
10. G. Palasantzas, J. Appl. Phys. 0021-8979 10.1063/1.1935127 97, 126104 (2005); G. Palasantzas and J. Th. M. De Hosson, Phys. Rev. B 0163-1829 10.1103/PhysRevB.72.115426 72, 115426 (2005); G. Palasantzas and J. Th. M. De Hosson, Phys. Rev. B 0163-1829 10.1103/PhysRevB.72.121409 72, 121409 (2005); G. Palasantzas and J. Th. M. De Hosson, Surf. Sci. 600, 1450 (2006).
11. G. Palasantzas, J. Appl. Phys. 0021-8979 10.1063/1.1935127 97, 126104 (2005); G. Palasantzas and J. Th. M. De Hosson, Phys. Rev. B 0163-1829 10.1103/PhysRevB.72.115426 72, 115426 (2005); G. Palasantzas and J. Th. M. De Hosson, Phys. Rev. B 0163-1829 10.1103/PhysRevB.72.121409 72, 121409 (2005); G. Palasantzas and J. Th. M. De Hosson, Surf. Sci. 600, 1450 (2006).
12. R. Maboudian and R. T. Howe, J. Vac. Sci. Technol. B 15, 1 (1997).
13. F. W. DelRio, M. L. Dunn, L. M. Phinney, C. J. Bourdon, and M. P. de Boer, Appl. Phys. Lett. 90, 163104 (2007).
14. A. Ata, Y. I. Rabinovich, and R. K. Singh, J. Adhes. Sci. Technol. 16, 337 (2002).
15. J. Freund, J. Halbritter, and J. K. H. Horber, Microsc. Res. Tech. 44, 327 (1999).
16. M. E. Abdelsalam, P. N. Bartlett, T. Kelf, and J. Baumberg, Langmuir 21, 1753 (2005).
17. M. Ma and R. M. Hill, Curr. Opin. Colloid Interface Sci. 11, 193 (2006).