Density of surface states in Pd/SiGe/Si interface from capacitance measurements

Surface Review and Letters

Volumn 14, Issue 4, 2007, Pages 765-768

  Sellai, A ^a   Mamor, M ^a   Al Harthi, S ^a  

^a SULTAN QABOOS UNIVERSITY   (Oman)

Author keywords

Capacitance spectroscopy; Interface states; Schottky barrier

Indexed keywords

CAPACITANCE; CHARACTERIZATION; IRRADIATION; PALLADIUM; SEMICONDUCTING SILICON COMPOUNDS; THERMAL EFFECTS;

ENERGY DISTRIBUTION; REVERSE BIAS; SURFACE STATES;

SCHOTTKY BARRIER DIODES;

EID: 34548458519     PISSN: 0218625X     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0218625X07010226     Document Type: Conference Paper

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