Recrystallization behaviour of the nickel-based alloy 80 a during hot forming

Journal of Microscopy

Volumn 227, Issue 3, 2007, Pages 267-274

  Mitsche, S ^a   Poelt, P ^a   Sommitsch, C ^b  

^a GRAZ UNIVERSITY OF TECHNOLOGY   (Austria)

^b UNIVERSITY OF LEOBEN   (Austria)

Author keywords

Electron backscatter diffraction; Nickel based alloy; Recrystallization; Scanning electron microscope

Indexed keywords

BACKSCATTERING; ELECTRON DIFFRACTION; NICKEL ALLOYS; SCANNING ELECTRON MICROSCOPY; STRAIN RATE;

DYNAMIC AND STATIC RECRYSTALLIZATION; DYNAMIC RECRYSTALLISATION; ELECTRON BACK SCATTER DIFFRACTION; ELECTRON BACKSCATTER DIFFRACTION; HOT FORMING; NICKEL BASED ALLOY; RECRYSTALLISATION; RECRYSTALLIZED GRAINS; SCANNING ELECTRON MICROSCOPE; SCANNING ELECTRONS;

DYNAMIC RECRYSTALLIZATION;

ALLOY; NICKEL;

CONFERENCE PAPER; CRYSTALLIZATION; ELECTRON DIFFRACTION; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY; TEMPERATURE SENSITIVITY; X RAY DIFFRACTION;

EID: 34548331868     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/j.1365-2818.2007.01810.x     Document Type: Conference Paper

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