메뉴 건너뛰기




Volumn 33, Issue 9-10, 2007, Pages 733-745

A lattice kinetic Monte Carlo study of void morphological evolution during silicon crystal growth

Author keywords

Lattice kinetic Monte Carlo; Oxygen; Oxygen vacancy complexes; Silicon; Vacancy aggregation

Indexed keywords

MONTE CARLO METHODS; MORPHOLOGY; OXYGEN; SILICON;

EID: 34548308908     PISSN: 08927022     EISSN: 10290435     Source Type: Journal    
DOI: 10.1080/08927020701310915     Document Type: Conference Paper
Times cited : (18)

References (33)
  • 4
    • 0035250956 scopus 로고    scopus 로고
    • Kinetic Monte Carlo simulation of the growth of polycrystalline Cu films
    • L.G. Wang, P. Clancy. Kinetic Monte Carlo simulation of the growth of polycrystalline Cu films. Surf, Sci., 473, 25 (2001).
    • (2001) Surf, Sci , vol.473 , pp. 25
    • Wang, L.G.1    Clancy, P.2
  • 5
    • 0033513692 scopus 로고    scopus 로고
    • A. La Magna, S. Coffa, L. Colombo. A lattice kinetic Monte Carlo code for the description of vacancy diffusion and self-organization in Si. Nucl. Instr. Meth. Phys. Res. B, 1.48, 262 (1999).
    • A. La Magna, S. Coffa, L. Colombo. A lattice kinetic Monte Carlo code for the description of vacancy diffusion and self-organization in Si. Nucl. Instr. Meth. Phys. Res. B, 1.48, 262 (1999).
  • 6
    • 29744464678 scopus 로고    scopus 로고
    • On-lattice kinetic Monte Carlo simulations of point defect aggregation in entropically influenced crystalline systems
    • J. Dai, J.M. Kanter, S.S. Kapur, W.D. Seider, T. Sinno. On-lattice kinetic Monte Carlo simulations of point defect aggregation in entropically influenced crystalline systems. Phys. Rev. B, 72, 134102 (2005).
    • (2005) Phys. Rev. B , vol.72 , pp. 134102
    • Dai, J.1    Kanter, J.M.2    Kapur, S.S.3    Seider, W.D.4    Sinno, T.5
  • 7
    • 33746585714 scopus 로고    scopus 로고
    • Lattice kinetic Monte Carlo simulations of defect evolution in crystals at elevated temperatures
    • J. Dai, W.D. Seider, T. Sinno. Lattice kinetic Monte Carlo simulations of defect evolution in crystals at elevated temperatures. Mol, Simul., 32, 305(2006).
    • (2006) Mol, Simul , vol.32 , pp. 305
    • Dai, J.1    Seider, W.D.2    Sinno, T.3
  • 8
    • 17544369634 scopus 로고    scopus 로고
    • DRAM wafer qualification issues: Oxide integrity vs. D-defects, oxygen precipitates and high temperature annealing
    • 1.996
    • J. Park, G. Rozgonyi. DRAM wafer qualification issues: oxide integrity vs. D-defects, oxygen precipitates and high temperature annealing. Solid State Phenom., 47-48, 327 (1.996).
    • Solid State Phenom , vol.47-48 , pp. 327
    • Park, J.1    Rozgonyi, G.2
  • 9
    • 0041760066 scopus 로고    scopus 로고
    • Internally consistent approach, for modeling solid-state aggregation. I. Atomistic calculations of vacancy clustering in silicon
    • M. Prasad, T. Sinno. Internally consistent approach, for modeling solid-state aggregation. I. Atomistic calculations of vacancy clustering in silicon. Phys. Rev B, 68, 045206 (2003).
    • (2003) Phys. Rev B , vol.68 , pp. 045206
    • Prasad, M.1    Sinno, T.2
  • 10
    • 0041837550 scopus 로고    scopus 로고
    • Internally consistent approach, for modeling solid-state aggregation. II. Mean-field representation of atomistic processes
    • M. Prasad, T. Sinno. Internally consistent approach, for modeling solid-state aggregation. II. Mean-field representation of atomistic processes. Phys. Rev, B, 68, 045207 (2003).
    • (2003) Phys. Rev, B , vol.68 , pp. 045207
    • Prasad, M.1    Sinno, T.2
  • 11
    • 33749158577 scopus 로고    scopus 로고
    • S.S. Kapur, M. Prasad, J.C. Crocker, T. Sinno. Role of configurational entropy in the thermodynamics of clusters of point defects in crystalline solids. Phys. Rev. B, 72, 014.119 (2005).
    • S.S. Kapur, M. Prasad, J.C. Crocker, T. Sinno. Role of configurational entropy in the thermodynamics of clusters of point defects in crystalline solids. Phys. Rev. B, 72, 014.119 (2005).
  • 12
    • 0034336203 scopus 로고    scopus 로고
    • On the properties of the intrinsic point defects in silicon: A perspective from crystal growth and wafer processing
    • R. Falster, V.V. Voronkov, F. Quast. On the properties of the intrinsic point defects in silicon: a perspective from crystal growth and wafer processing. Phys. Stat. Sol. B, 222, 219 (2000).
    • (2000) Phys. Stat. Sol. B , vol.222 , pp. 219
    • Falster, R.1    Voronkov, V.V.2    Quast, F.3
  • 13
  • 15
    • 33750910068 scopus 로고    scopus 로고
    • T.A. .Frewen, T. Sinno. Vacancy self-trapping during rapid thermal annealing of silicon wafers. Appl. Phys. Lett., 89, 191903 (2006).
    • T.A. .Frewen, T. Sinno. Vacancy self-trapping during rapid thermal annealing of silicon wafers. Appl. Phys. Lett., 89, 191903 (2006).
  • 16
    • 18444391820 scopus 로고    scopus 로고
    • A microscopically accurate continuum model for void formation during semiconductor silicon processing
    • T.A. Frewen, S.S. Kapur, W. Haeckl, W. von Ammon, T. Sinno. A microscopically accurate continuum model for void formation during semiconductor silicon processing. J. Cryst. Growth, 279,258 (2005).
    • (2005) J. Cryst. Growth , vol.279 , pp. 258
    • Frewen, T.A.1    Kapur, S.S.2    Haeckl, W.3    von Ammon, W.4    Sinno, T.5
  • 17
    • 0032649508 scopus 로고    scopus 로고
    • Modeling mierodefect formation in Czochralski silicon
    • 1.999
    • T. Sinno, R.A. Brown. Modeling mierodefect formation in Czochralski silicon. J. Electrochem. Soc., 146, 2300 (1.999).
    • J. Electrochem. Soc , vol.146 , pp. 2300
    • Sinno, T.1    Brown, R.A.2
  • 19
    • 0000727267 scopus 로고
    • The mechanism, of swirl defects formation in silicon
    • V. Voronkov. The mechanism, of swirl defects formation in silicon. J Cryst. Growth, 59, 625 (1982).
    • (1982) J Cryst. Growth , vol.59 , pp. 625
    • Voronkov, V.1
  • 20
    • 0031700773 scopus 로고    scopus 로고
    • Point defect dynamics and the oxidation-induced stacking-fault ring in Czochralski-grown silicon crystals
    • T. Sinno, R.A. Brown, W. von Ammon, E. Dornberger. Point defect dynamics and the oxidation-induced stacking-fault ring in Czochralski-grown silicon crystals. J. Electrochem. Sco., 145, 302 (1998).
    • (1998) J. Electrochem. Sco , vol.145 , pp. 302
    • Sinno, T.1    Brown, R.A.2    von Ammon, W.3    Dornberger, E.4
  • 21
    • 34548300874 scopus 로고    scopus 로고
    • J. Vanhellemont, E. Dornberger, J. Esfandyari, G. Kissinger, M.A. Trauwaert, H. Bender, D. Graf, U. Lambert, W. von Ammon.Defects in as-grown silicon and their evolution during heat treatments. Mater. Sci. Forum, ICDS 1.9 (1.997).
    • J. Vanhellemont, E. Dornberger, J. Esfandyari, G. Kissinger, M.A. Trauwaert, H. Bender, D. Graf, U. Lambert, W. von Ammon.Defects in as-grown silicon and their evolution during heat treatments. Mater. Sci. Forum, ICDS 1.9 (1.997).
  • 22
    • 0036530550 scopus 로고    scopus 로고
    • M. Itsumi. Octahedral void defects in Czochralski. silicon. J. Cryst, Growth, 237-239, 1.773 (2002).
    • M. Itsumi. Octahedral void defects in Czochralski. silicon. J. Cryst, Growth, 237-239, 1.773 (2002).
  • 23
    • 0033902295 scopus 로고    scopus 로고
    • Formation of voids and oxide particles in silicon crystals
    • VV. Voronkov. Formation of voids and oxide particles in silicon crystals. Mater. Sci. Eng. B, 73, 69 (2000).
    • (2000) Mater. Sci. Eng. B , vol.73 , pp. 69
    • Voronkov, V.V.1
  • 24
    • 0035366011 scopus 로고    scopus 로고
    • Diffusion-limited growth of single- and double-octahedral voids in silicon and the effect of surface oxygen monolayer
    • V.V. Voronkov, R. Falster. Diffusion-limited growth of single- and double-octahedral voids in silicon and the effect of surface oxygen monolayer. J. Cryst. Growth, 226, 192 (2001).
    • (2001) J. Cryst. Growth , vol.226 , pp. 192
    • Voronkov, V.V.1    Falster, R.2
  • 25
    • 0000363781 scopus 로고    scopus 로고
    • Environmental-dependent interatomic potential for bulk silicon
    • M.Z. Bazant, E. Kaxiras, J.F. Justo. Environmental-dependent interatomic potential for bulk silicon. Phys. Rev, B, 56, 8542 (1997).
    • (1997) Phys. Rev, B , vol.56 , pp. 8542
    • Bazant, M.Z.1    Kaxiras, E.2    Justo, J.F.3
  • 26
    • 34548306084 scopus 로고    scopus 로고
    • R.C Newman. Early Stage of Oxygen Precipitation in Silicon, R. Jones (Ed.), Kluwer Academic Publishers, Dordrecht (1.996).
    • R.C Newman. Early Stage of Oxygen Precipitation in Silicon, R. Jones (Ed.), , Kluwer Academic Publishers, Dordrecht (1.996).
  • 27
    • 0006709799 scopus 로고    scopus 로고
    • Interaction of vacancies with interstitial oxygen in silicon
    • R.A. Casali, H. Rucker, M. Methfessel. Interaction of vacancies with interstitial oxygen in silicon. Appl. Phys. Lett., 78, 913 (2001).
    • (2001) Appl. Phys. Lett , vol.78 , pp. 913
    • Casali, R.A.1    Rucker, H.2    Methfessel, M.3
  • 28
    • 0001703125 scopus 로고    scopus 로고
    • Computational study of interstitial oxygen and vacancy-oxygen complexes in silicon
    • 1.1449 1.999
    • M. Pesola, J. von Boehm, T. Manila, R.M. Nieminen. Computational study of interstitial oxygen and vacancy-oxygen complexes in silicon. Phys. Rev. B, 60, 1.1449 (1.999).
    • Phys. Rev. B , vol.60
    • Pesola, M.1    von Boehm, J.2    Manila, T.3    Nieminen, R.M.4
  • 29
    • 34548320534 scopus 로고    scopus 로고
    • Oxygen, carbon, hydrogen, and nitrogen in silicon
    • Princeton, NJ 1.9 1.986
    • J.C. Mikkelsen. Oxygen, carbon, hydrogen, and nitrogen in silicon. Mater. Res. Soc. Symp. Proc, Princeton, NJ 1.9 (1.986).
    • Mater. Res. Soc. Symp. Proc
    • Mikkelsen, J.C.1
  • 30
    • 0006420591 scopus 로고
    • Diffusion limited oxygen precipitation in silicon: Precipitate growth kinetics and phase formation
    • J. Vanhellemont. Diffusion limited oxygen precipitation in silicon: precipitate growth kinetics and phase formation. J. Appl. Phys., 78, 4297 (1995).
    • (1995) J. Appl. Phys , vol.78 , pp. 4297
    • Vanhellemont, J.1
  • 31
    • 0001518068 scopus 로고    scopus 로고
    • On the impact of interface energy and vacancy concentration on morphology changes and nucleation of silicon oxide precipitates in silicon
    • J. Vanhellemont. On the impact of interface energy and vacancy concentration on morphology changes and nucleation of silicon oxide precipitates in silicon. Appl, Phys. Lett., 68, 3413 (1996).
    • (1996) Appl, Phys. Lett , vol.68 , pp. 3413
    • Vanhellemont, J.1
  • 32
    • 15944414201 scopus 로고    scopus 로고
    • A systemsbased approach for generating quantitative models of microstructural evolution in silicon materials processing
    • TA. Frewen, T. Sinno, W. Haeckl, W. von Ammon. A systemsbased approach for generating quantitative models of microstructural evolution in silicon materials processing. Comput. Chem. Eng., 29, 713 (2005).
    • (2005) Comput. Chem. Eng , vol.29 , pp. 713
    • Frewen, T.A.1    Sinno, T.2    Haeckl, W.3    von Ammon, W.4
  • 33
    • 33646109512 scopus 로고    scopus 로고
    • The kinetics of precipitation from, supersaturated solid solutions
    • 1.961
    • I.M. Lifshitz, V.V. Slyozov. The kinetics of precipitation from, supersaturated solid solutions. J. Phys. Chem. Solids, 19, 35 (1.961).
    • J. Phys. Chem. Solids , vol.19 , pp. 35
    • Lifshitz, I.M.1    Slyozov, V.V.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.