AFM investigation of Martian soil simulants on micromachined Si substrates

Journal of Microscopy

Volumn 227, Issue 3, 2007, Pages 236-245

  Vijendran, S ^a   Sykulska, H ^a   Pike, W T ^a  

^a IMPERIAL COLLEGE LONDON   (United Kingdom)

Author keywords

Atomic force microscopy; Mars; Micromachining; Particles

Indexed keywords

ASPECT RATIO; NASA; SCREENING; SOILS; SUBSTRATES;

ATOMIC-FORCE-MICROSCOPY; MARS; MARTIAN SOILS; MICRO AND NANOSTRUCTURES; MICRO-MACHINED; MICROMETER SIZES; OPTICAL FORCE; PARTICLE; SI SUBSTRATES; SIZE RANGES;

ATOMIC FORCE MICROSCOPY;

NANOMATERIAL; SILICON;

ARTICLE; ATOMIC FORCE MICROSCOPY; DUST; ELECTRICITY; NANOSENSOR; PARTICLE SIZE; PRIORITY JOURNAL; SOIL ANALYSIS; SOIL POLLUTION; TOPOGRAPHY;

EID: 34548303953     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/j.1365-2818.2007.01806.x     Document Type: Article

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