Analytical TEM Investigations of High-Temperature Superconductors

Mikrochimica Acta

Volumn 125, Issue 1, 1997, Pages 307-311

  Thomas, Jürgen ^a  

^a IFW DRESDEN   (Germany)

Author keywords

Analytical TEM; EDXS; Electron diffraction; High temperature superconductors

Indexed keywords

EID: 0004720992     PISSN: 00263672     EISSN: None     Source Type: Journal    
DOI: 10.1007/bf01246203     Document Type: Article

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