Thin film analysis in the nanometer scale

Fresenius' Journal of Analytical Chemistry

Volumn 355, Issue 5-6, 1996, Pages 447-451

  Wetzig, Klaus ^a   Bauer, Hans Dietrich ^a  

^a IFW DRESDEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL ANALYSIS; CHEMICAL COMPOSITION; MICROSTRUCTURE; MORPHOLOGY; REVIEWS; TEM;

IMAGE FORMING; NANOMETER SCALE;

THIN FILMS;

EID: 0030356071     PISSN: 09370633     EISSN: None     Source Type: Journal    
DOI: 10.1007/s0021663550447     Document Type: Article

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