Ray-trace calculations for in situ X-ray beam imaging

Journal of Synchrotron Radiation

Volumn 14, Issue 5, 2007, Pages 439-445

  Kyele, Nicholas R ^a   Van Silfhout, Roelof G ^a  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

Author keywords

Beam position monitor; Beam profile monitor; Ray tracing; X rays

Indexed keywords

MATHEMATICAL MODELS; METAL FOIL; POLYIMIDES; RAY TRACING; SENSITIVITY ANALYSIS; TWO DIMENSIONAL;

BEAM IMAGES; BEAM-POSITION MONITORS; BEAM-PROFILE MONITORS; GEOMETRICAL PROPERTIES;

SYNCHROTRONS;

EID: 34548284359     PISSN: 09090495     EISSN: 16005775     Source Type: Journal    
DOI: 10.1107/S0909049507029664     Document Type: Article

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