In situ synchrotron x-ray photon beam characterization

Journal of Applied Physics

Volumn 101, Issue 6, 2007, Pages

  Kyele, Nicholas R ^a   Van Silfhout, Roelof G ^a   Manolopoulos, Spyros ^b   Nikitenko, S ^c  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

^b RUTHERFORD APPLETON LABORATORY   (United Kingdom)

^c EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; LIGHT MEASUREMENT; LIGHT SCATTERING; PIXELS; X RAY ANALYSIS;

ABSOLUTE INTENSITY; AMORPHOUS FOILS; X-RAY BEAM PARAMETERS;

SYNCHROTRON RADIATION;

EID: 34047159905     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2711150     Document Type: Article

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