Surface dipole formation and lowering of the work function by Cs adsorption on InP(100) surface

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 25, Issue 5, 2007, Pages 1351-1356

  Sun, Yun ^a   Liu, Zhi ^a   Pianetta, Piero ^a  

^a SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; CHARGE TRANSFER; INDIUM PHOSPHIDE; PHOTOELECTRON SPECTROSCOPY; SYNCHROTRON RADIATION; WORK FUNCTION;

INTENSITY SATURATION; MINIMUM WORK FUNCTIONS; SURFACE DIPOLE FORMATION; SYNCHROTRON RADIATION PHOTOELECTRON SPECTROSCOPY;

SURFACE PHENOMENA;

EID: 34548215082     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.2753845     Document Type: Article

References (27)

1. R. L. Bell, Negative Electron Affinity Devices (Clarenden, Oxford, 1973).
2. Z. Liu, F. Machuca, P. Pianetta, W. E. Spicer, and R. F. W. Pease, Appl. Phys. Lett. 85, 1541 (2004).
3. J. D. White, J. Chen, D. Matsiev, D. J. Auerbach, and A. M. Wodtke, Nature (London) 433, 503 (2005).
4. W. Monch, J. Vac. Sci. Technol. B 4, 1085 (1986).
5. W. Monch, Rep. Prog. Phys. 53, 221 (1990).
6. F. Bechstedt and M. Scheffler, Surf. Sci. Rep. 18, 145 (1993).
7. J. Topping, Proc. R. Soc. London, Ser. A 114, 67 (1927).
8. H. J. Clemens, J. Von Wienskowski, and W. Monch, Surf. Sci. 78, 648 (1978).
9. J. Derrien and F. Arnauddavitaya, Surf. Sci. 65, 668 (1977).
10. N. J. Dinardo, T. M. Wong, and E. W. Plummer, Phys. Rev. Lett. 65, 2177 (1990).
11. P. N. First, R. A. Dragoset, J. A. Stroscio, R. J. Celotta, and R. M. Feenstra, J. Vac. Sci. Technol. A 7, 2868 (1989).
12. Z. Gedik, S. Ciraci, and I. P. Batra, Phys. Rev. B 47, 16391 (1993).
13. M. Kamaratos and E. Bauer, J. Appl. Phys. 70, 7564 (1991).
14. T. Kendelewicz, P. Soukiassian, M. H. Bakshi, Z. Hurych, I. Lindau, and W. E. Spicer, Phys. Rev. B 38, 7568 (1988).
15. S. E. Kulkova, D. V. Khanin, and A. Subashiev, Nucl. Instrum. Methods Phys. Res. A 536, 295 (2005).
16. T. J. Lee, B. H. Blott, and B. J. Hopkins, J. Phys. F: Met. Phys. 1, 309 (1971).
17. L. J. Whitman, J. A. Stroscio, R. A. Dragoset, and R. J. Celotta, Phys. Rev. Lett. 66, 1338 (1991).
18. T. Kendelewicz, P. Soukiassian, M. H. Bakshi, Z. Hurych, I. Lindau, and W. E. Spicer, J. Vac. Sci. Technol. B 6, 1331 (1988).
19. Th. Chasse, G. Neuhold, J. J. Paggel, and K. Horn, Surf. Sci. 331/333, 528 (1995).
20. L. Zhong, S. Gao, and D. Wang, Phys. Rev. B 47, 9791 (1993).
21. Y. Sun, Z. Liu, F. Machuca, P. Pianetta, and W. E. Spicer, J. Appl. Phys. 97, 1 (2005).
22. P. Pianetta, in Speciman Handling, Preparation, and Treatments in Surface Characterization, edited by, Czanderna, (Kluwer Academic/Plenum, New York, 1998).
23. S. Tanuma, C. J. Powell, and D. R. Penn, Surf. Interface Anal. 21, 165 (1994).
24. K. Yamada, J. Asanari, M. Naitoh, and S. Nishigaki, Surf. Sci. 402-404, 683 (1998).
25. D. A. Evans, G. J. Lapeyre, and K. Horn, Phys. Rev. B 48, 1939 (1993).
26. S. Tanuma, C. J. Powell, and D. R. Penn, Surf. Interface Anal. 17, 927 (1991).
27. A. M. James and M. P. Loard, Macmillan's Chemical and Physical Data (Macmillan, London, UK, 1992).