Microstructural response of TiN monolithic and multilayer coatings during microscratch testing

Journal of Materials Research

Volumn 22, Issue 8, 2007, Pages 2312-2318

  Xie, Z H ^a   Hoffman, M ^a   Munroe, P ^a   Singh, R ^a   Bendavid, A ^b   Martin, P J ^b  

^a UNIVERSITY OF NEW SOUTH WALES   (Australia)

^b CSIRO   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

DEFORMATION; FOCUSED ION BEAMS; MULTILAYERS; SCANNING ELECTRON MICROSCOPY; TITANIUM NITRIDE; TRANSMISSION ELECTRON MICROSCOPY;

CONTACT DAMAGE; FILTERED ARC DEPOSITION; INTERCOLUMNAR SHEAR SLIDING; MICROSCRATCH TEST; TANGENTIAL FORCE;

INORGANIC COATINGS;

EID: 34548139384     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/jmr.2007.0292     Document Type: Article

References (17)

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