Dielectric properties characterization of La- and Dy-doped BiFeO3 thin films

Journal of Materials Research

Volumn 22, Issue 8, 2007, Pages 2179-2184

  Petrov, Peter Kr ^a   Palkar, Vaijayanti R ^b   Tagantsev, Alexander K ^c   Chien, Hsin I ^d   Prashanthi, K ^e   Axelsson, Anna Karin ^a   Bhattacharya, S ^b   Alford, Neil McN ^a  

^a IMPERIAL COLLEGE LONDON   (United Kingdom)

^b TATA INSTITUTE OF FUNDAMENTAL RESEARCH   (India)

^c EPFL   (Switzerland)

^d LONDON SOUTH BANK UNIVERSITY   (United Kingdom)

^e INDIAN INSTITUTE OF TECHNOLOGY BOMBAY   (India)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; DIELECTRIC PROPERTIES; ELECTRIC FIELD EFFECTS; LEAKAGE CURRENTS; MAGNETIC FIELD EFFECTS; MICROWAVE FREQUENCIES; MICROWAVE MEASUREMENT; THIN FILMS;

DIRECT CURRENT; NON-MONOTONIC FUNCTION;

METALLIC FILMS;

EID: 34548134104     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/jmr.2007.0287     Document Type: Article

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