Dielectric constant and loss tangent of thin ferroelectric films at microwave frequencies-how accurately can we evaluate them?

Integrated Ferroelectrics

Volumn 97, Issue 1, 2008, Pages 27-37

  Petrov, Peter K ^a   Pan, Yuya ^b   Zou, Bin ^b   Alford, Neil McN ^a  

^a IMPERIAL COLLEGE LONDON   (United Kingdom)

^b LONDON SOUTH BANK UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITOR STRUCTURES; CO-PLANAR ELECTRODES; DIELECTRIC CONSTANTS; LOSS TANGENT; PARALLEL PLATES; Q-FACTOR VALUE; QUALITY FACTORS; RELATIVE DIELECTRIC CONSTANT; SIMPLIFIED METHOD;

CAPACITANCE; CERAMIC CAPACITORS; CURVE FITTING; DIELECTRIC MATERIALS; DIELECTRIC WAVEGUIDES; FERROELECTRIC DEVICES; FERROELECTRIC FILMS; FERROELECTRICITY; MATERIALS PROPERTIES; MICROWAVE FREQUENCIES; PERMITTIVITY; PLATES (STRUCTURAL COMPONENTS); POTENTIAL FLOW; Q FACTOR MEASUREMENT; QUALITY CONTROL;

UNCERTAINTY ANALYSIS;

EID: 66149091059     PISSN: 10584587     EISSN: 16078489     Source Type: Journal    
DOI: 10.1080/10584580802086201     Document Type: Article

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