Measurement technique for the static output characterization of high-current power MOSFETs

IEEE Transactions on Instrumentation and Measurement

Volumn 56, Issue 4, 2007, Pages 1347-1354

  López, Toni ^a   Elferich, Reinhold ^a  

^a PHILIPS RESEARCH LABORATORIES   (Germany)

Author keywords

High current; Measurement uncertainty errors; Parasitic impedances; Power metal oxide semiconductor field effect transistors (MOSFETs); Self heating; Static output characteristics

Indexed keywords

ELECTRIC PARASITIC IMPEDANCE; STATIC OUTPUT CHARACTERISTIC; VOLTAGE RAMP;

ELECTRIC IMPEDANCE; ELECTRIC POTENTIAL; MEASUREMENT ERRORS; VOLTAGE MEASUREMENT;

MOSFET DEVICES;

EID: 34547903542     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2007.900146     Document Type: Article

References (7)

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