In situ vibrational study of SiO2/liquid interfaces

Surface Science

Volumn 502-503, Issue , 2002, Pages 498-502

  Fukidome, H ^a,b   Pluchery, O ^a   Queeney, K T ^a   Caudano, Y ^c   Raghavachari, K ^a   Weldon, M K ^d   Chaban, E E ^d   Christman, S B ^a   Kobayashi, H ^b   Chabal, Y J ^a  

^a AGERE SYSTEMS   (United States)

^b OSAKA UNIVERSITY   (Japan)

^c LASMOS   (Belgium)

^d LUCENT TECHNOLOGIES   (United States)

Author keywords

Ab initio quantum chemical methods and calculations; Infrared absorption spectroscopy; Silicon oxides; Solid liquid interfaces

Indexed keywords

COLLOIDS; ELECTRIC POTENTIAL; ELECTROCHEMISTRY; FOURIER TRANSFORM INFRARED SPECTROSCOPY; LATTICE VIBRATIONS; SILICA; SURFACE STRUCTURE;

SOLID-LIQUID INTERFACES;

INTERFACES (MATERIALS);

EID: 18344404659     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(01)01998-7     Document Type: Conference Paper

References (13)

1. The Chemistry of Silica
2. Gaussian 98