Analysis of artificial silicon microstructures by ultra-small-angle and spin-echo small-angle neutron scattering

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 579, Issue 3, 2007, Pages 1081-1089

  Trinker, M ^a   Jericha, E ^a   Bouwman, W G ^b   Loidl, R ^a,c   Rauch, H ^a  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

^b DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^c INSTITUT LAUE LANGEVIN   (France)

Author keywords

Neutron instrumentation; Neutron optics; Reconstruction; SESANS; USANS

Indexed keywords

ANISOTROPIC ETCHING; DIFFRACTION GRATINGS; SIGNAL ANALYSIS; SILICON COMPOUNDS; SPIN DYNAMICS;

NEUTRON INSTRUMENTATION; NEUTRON OPTICS; SESANS; USANS;

NEUTRON SCATTERING;

EID: 34547841276     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2007.06.008     Document Type: Article

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