In-situ visualization of local field enhancement in an ultra sharp tungsten emitter under a low voltage scanning transmission electron microscope

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 46, Issue 20-24, 2007, Pages

  Fujita, Jun Ichi ^a,b   Ikeda, Yuta ^a,b   Okada, Satoshi ^a,b   Higashi, Kodai ^a,b   Nakazawa, Shotaro ^a,b   Ishida, Masahiko ^a,c   Matsui, Shinji ^a,d  

^a JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^b UNIVERSITY OF TSUKUBA   (Japan)

^c NEC CORPORATION   (Japan)

^d UNIVERSITY OF HYOGO   (Japan)

Author keywords

Electric field; Field emission; Nanotube; STEM; Visualization

Indexed keywords

ELECTRIC FIELDS; FIELD EMISSION; JOULE HEATING; MATHEMATICAL MODELS; TRANSMISSION ELECTRON MICROSCOPY;

ACCELERATING VOLTAGE; DARK SHADOW; LOCAL FIELD ENHANCEMENT;

MULTIWALLED CARBON NANOTUBES (MWCN);

EID: 34547838416     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.46.L498     Document Type: Article

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