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Volumn 46, Issue 6 A, 2007, Pages 3391-3393
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Detecting real oxygen ions in polycrystalline diamond thin film using secondary ion mass spectrometry
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Author keywords
Chemical vapor deposition; Diamond; Oxygen; Secondary ion mass spectrometry
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Indexed keywords
CHEMICAL VAPOR DEPOSITION;
DIAMONDS;
OXYGEN;
POLYCRYSTALLINE MATERIALS;
SECONDARY ION MASS SPECTROMETRY;
THIN FILMS;
DIAMOND THIN FILM;
OXYGEN IONS;
DIAMOND FILMS;
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EID: 34547828852
PISSN: 00214922
EISSN: 13474065
Source Type: Journal
DOI: 10.1143/JJAP.46.3391 Document Type: Article |
Times cited : (5)
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References (16)
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