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Volumn 46, Issue 6 A, 2007, Pages 3391-3393

Detecting real oxygen ions in polycrystalline diamond thin film using secondary ion mass spectrometry

Author keywords

Chemical vapor deposition; Diamond; Oxygen; Secondary ion mass spectrometry

Indexed keywords

CHEMICAL VAPOR DEPOSITION; DIAMONDS; OXYGEN; POLYCRYSTALLINE MATERIALS; SECONDARY ION MASS SPECTROMETRY; THIN FILMS;

EID: 34547828852     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.46.3391     Document Type: Article
Times cited : (5)

References (16)
  • 4
    • 33748032095 scopus 로고    scopus 로고
    • J. Ristein: Science 313 (2006) 1057.
    • (2006) Science , vol.313 , pp. 1057
    • Ristein, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.