Electrical characterization of InAs/GaAs quantum dots by frequency spectroscopy

Materials Science and Engineering C

Volumn 27, Issue 5-8 SPEC. ISS., 2007, Pages 936-940

  Engstrom O ^a   Eghtedari, A ^a   Kaniewska, M ^b  

^a CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

^b ukasiewicz Research Network Institute of Microelectronics and Photonics   (Poland)

Author keywords

DLTS; Self assembled InAs GaAs quantum dots; Small signal steady state capacitance method

Indexed keywords

CAPACITANCE; ELECTRIC SPACE CHARGE; EMBEDDED SYSTEMS; SELF ASSEMBLY;

ELECTRON ORBITALS; EMISSION PROCESSES; SIGNAL FREQUENCY DEPENDENCE;

SEMICONDUCTOR QUANTUM DOTS;

EID: 34547776258     PISSN: 09284931     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.msec.2006.09.026     Document Type: Article

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