Structure and electrical properties of bismuth thin films prepared by flash evaporation method

Materials Letters

Volumn 61, Issue 22, 2007, Pages 4341-4343

  Duan, Xingkai ^a   Yang, Junyou ^a   Zhu, Wen ^a   Fan, Xi'an ^a   Xiao, Chengjing ^a  

^a HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

Author keywords

Bismuth; Electrical properties; Flash evaporation; Thin films

Indexed keywords

BISMUTH COMPOUNDS; ELECTRIC PROPERTIES; EVAPORATION; MOLECULAR STRUCTURE; THIN FILMS; X RAY DIFFRACTION;

FLASH EVAPORATION; HALL COEFFICIENT; OSCILLATORY BEHAVIOR;

POLYCRYSTALLINE MATERIALS;

EID: 34547684798     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matlet.2007.01.098     Document Type: Article

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