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Volumn 579, Issue 1, 2007, Pages 108-112
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A fast screening technique to evaluate detector response
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Author keywords
Energy resolution; Pulse height defect; Si detector calibration
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Indexed keywords
LIGHT SCATTERING;
TELESCOPES;
ENERGY RESOLUTION;
PULSE HEIGHT DEFECT;
SI DETECTOR CALIBRATION;
SILICON DETECTORS;
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EID: 34547678610
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/j.nima.2007.04.019 Document Type: Article |
Times cited : (9)
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References (13)
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