Carrier leakage blocking effect of high temperature sputtered TiO2 film on dye-sensitized mesoporous photoelectrode

Thin Solid Films

Volumn 515, Issue 20-21, 2007, Pages 8045-8049

  Hattori, Ryo ^a   Goto, Hajime ^b,c  

^a MITSUBISHI ELECTRIC CORPORATION   (Japan)

^b Ion Eng Res Institute Corporation   (Japan)

^c NEDO ^*  (Japan)

Author keywords

Carrier leakage blocking; Dye sensitized solar cell; Mesoporous electrode; Rutile crystalline film; Sputtered TiO2 film

Indexed keywords

ELECTRODES; HIGH TEMPERATURE EFFECTS; MESOPOROUS MATERIALS; SHORT CIRCUIT CURRENTS; SOLAR CELLS; SPUTTERING; TITANIUM DIOXIDE; X RAY DIFFRACTION;

CARRIER LEAKAGE BLOCKING; DYE SENSITIZED SOLAR CELLS; MESOPOROUS ELECTRODES; RUTILE CRYSTALLINE FILMS;

OXIDE FILMS;

EID: 34547659014     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2007.03.079     Document Type: Article

References (28)

1. O'Regan B., and Grätzel M. Nature 353 (1991) 737
2. Tsubomura H., Matsumura M., Nomura Y., and Amamiya T. Nature 261 (1976) 402
3. Grätzel M. J. Photochem. Photobiol., A Chem. 164 (2004) 3
4. Nazeeruddin M.K., Kay A., Rodicio I., Humphry-Baker R., Müller E., Liska P., Vlachopoulos N., and Grätzel M. J. Am. Chem. Soc. 115 (1993) 6382
5. Barbé C.J., Arendse F., Compte P., Jirousek M., Lenzmann F., Shklover V., and Grätzel M. J. Am. Ceram. Soc. 80 (1997) 3157
6. Yoshida T., Terada K., Shlettwein D., Oekermann T., Sugiura T., and Minoura H. Adv. Mater. 12 (2000) 1214
7. Yoshida T., Oekermann T., Okabe K., Shlettwein D., Funabiki K., and Minoura H. Electrochemistry 70 (2002) 470
8. Wang Z.S., Kawauchi H., Kashima T., and Arakawa H. Coord. Chem. Rev. 248 (2004) 80
9. Kambe S., Nakade S., Kitamura T., Wada Y., and Yanagida S. J. Phys. Chem., B 106 (2002) 9150
10. Hara K., Kurashige M., Don-oh Y., Kasada C., Shinpo A., Suga S., Sayama K., and Arakawa H. New J. Chem. 27 (2003) 783
11. Ito S., Liska P., Comte P., Charvet R., Péchy P., Bach U., Schmidt-Mende L., Zakeeruddin S.M., Kay A., Nazeeruddin M.K., and Grätzel M. Chem. Commun. (2001) 4351
12. Peng B., Jungmann G., Jäger C., Haarer D., Schmidt H.-W., and Thelakkat M. Coord. Chem. Rev. 248 (2001) 1479
13. Spiekerman S., Smestad G., Kowalik J., Tolbert L.M., and Grätzel M. Synth. Met. 121 (2001) 1603
14. Krüger J., Plass R., Cevey L., Piccirelli M., and Grätzel M. Appl. Phys. Lett. 79 (2001) 2085
15. Song P.K., Irie Y., Ohno S., Sato Y., and Shigesato Y. Jpn. J. Appl. Phys. 43 (2004) L442
16. Ohno S., Sato D., Kon M., Yoshikawa M., Suzuki K., Frach P., and Shigesato Y. Thin Solid Films 445 (2003) 207
17. Song P.K., Yamagishi M., Odaka H., and Shigesato Y. Jpn. J. Appl. Phys. 42 (2003) L1529
18. Anpo M., and Chiba K. J. Mol. Catal. 74 (1992) 207
19. Ikeue K., Yamashita H., and Anpo M. Chem. Lett. (1999) 1135
20. Yamashita H., Ichihashi Y., Harada M., Stewart G., Fox M.A., and Anpo M. J. Catal. 158 (1996) 97
21. Song P.K., Shigesato Y., Kamei M., and Yasui I. Jpn. J. Appl. Phys. 38 (1999) 2921
22. Yamagishi M., Kuriki S., Song P.K., and Shigesato Y. Thin Solid Films 442 (2003) 227
23. Song P.K., Irie Y., Ohno S., Sato Y., and Shigesato Y. Jpn. J. Appl. Phys. 43 (2004) L442
24. Batsanov S.S., Bobovich Ya.S., Bokarev V.P., Lazareva E.V., and Tsenter M.Ya. Opt. Spectrosc. 68 (1990) 632
25. Parker J.C., and Siegel R.W. Appl. Phys. Lett. 57 (1990) 943
26. Nemanich R.J., Tsai C.C., and Connell G.A.N. Phys. Rev. Lett. 44 (1980) 273
27. Begun G.M., and Bamberger C.E. Appl. Spectrosc. 43 (1989) 134
28. Tompsett G.A., Bowmaker G.A., Cooney R.P., Metson J.B., Rodgers K.A., and Seakins J.M. J. Raman Spectrosc. 26 (1995) 57