Polysilicon high frequency devices for large area electronics: Characterization, simulation and modeling

Thin Solid Films

Volumn 515, Issue 19 SPEC. ISS., 2007, Pages 7422-7427

  Botrel, J L ^a,b   Savry, O ^a   Rozeau, O ^a   Templier, F ^a   Jomaah, J ^b  

^a CEA LETI   (France)

^b IMEP LAHC   (France)

Author keywords

Computer simulation; Electrical properties and measurements; Metal oxide semiconductor structure; Polysilicon

Indexed keywords

COMPUTER SIMULATION; ELECTRIC PROPERTIES; ELECTRONIC DOCUMENT IDENTIFICATION SYSTEMS; MOLECULAR ELECTRONICS; THIN FILM TRANSISTORS;

EFFECTIVE MEDIUM FRAMEWORK; HIGH-FREQUENCY APPLICATIONS; SCATTERING-PARAMETERS; SMALL-SIGNAL CIRCUIT;

POLYSILICON;

EID: 34547599226     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2006.11.088     Document Type: Article

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