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Volumn 25, Issue 4, 2007, Pages 1437-1440

Influence of interface roughness on quantum transport in nanoscale FinFET

Author keywords

[No Author keywords available]

Indexed keywords

CONTACT BLOCK REDUCTION METHOD; INTERFACE ROUGHNESS; NANOSCALE FINFET; QUANTUM TRANSPORT;

EID: 34547588283     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.2748414     Document Type: Article
Times cited : (12)

References (10)
  • 10
    • 84858095870 scopus 로고    scopus 로고
    • International Technology Roadmap for Semiconductors (ITRS), link to http://public.itrs.net, 2006.
    • (2006)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.