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Volumn 25, Issue 4, 2007, Pages 1437-1440
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Influence of interface roughness on quantum transport in nanoscale FinFET
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Author keywords
[No Author keywords available]
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Indexed keywords
CONTACT BLOCK REDUCTION METHOD;
INTERFACE ROUGHNESS;
NANOSCALE FINFET;
QUANTUM TRANSPORT;
COMPUTER SIMULATION;
INTERFACES (MATERIALS);
NANOSTRUCTURED MATERIALS;
QUANTUM THEORY;
RANDOM PROCESSES;
FIELD EFFECT TRANSISTORS;
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EID: 34547588283
PISSN: 10711023
EISSN: None
Source Type: Journal
DOI: 10.1116/1.2748414 Document Type: Article |
Times cited : (12)
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References (10)
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