Tomographic quantitative phase measurement by hard X-ray micro-interferometer with 250 nm spatial resolution

Spectrochimica Acta - Part B Atomic Spectroscopy

Volumn 62, Issue 6-7 SPEC. ISS., 2007, Pages 603-607

  Koyama, Takahisa ^a   Takano, Hidekazu ^a   Tsusaka, Yoshiyuki ^a   Kagoshima, Yasushi ^a  

^a UNIVERSITY OF HYOGO   (Japan)

Author keywords

Phase contrast; Phase retrieval; X ray interferometer; X ray tomography; Zone plate

Indexed keywords

INTERFEROMETERS; OPTICAL RESOLVING POWER; THREE DIMENSIONAL; TOMOGRAPHY;

PHASE CONTRAST; PHASE RETRIEVAL; X-RAY INTERFEROMETERS; X-RAY TOMOGRAPHY;

PHASE MEASUREMENT;

EID: 34547583356     PISSN: 05848547     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sab.2007.02.021     Document Type: Article

References (25)

1. Momose A., and Fukuda J. Phase-contrast radiographs of nonstained rat cerebellar specimen. Med. Phys. 22 (1995) 375-379
2. Bonse U., Beckmann F., Bartscher M., Biermann T., Busch F., and Günnewig O. Phase contrast X-ray tomography using synchrotron radiation. In: Bonse U. (Ed). Developments in X-ray Tomography. Proceedings of SPIE vol. 3149 (1997), SPIE, Bellingham 108-119
3. Wu J., Takeda T., Lwin T.T., Koyama I., Momose A., Fujii A., Hamaishi Y., Kuroe T., Yuasa T., Suzuki Y., and Akatsuka T. Micro-phase-contrast X-ray computed tomography for basic biomedical research in SPring-8. In: Bonse U. (Ed). Developments in X-ray Tomography IV. Proceedings of SPIE vol. 5535 (2004), SPIE, Bellingham 740-747
4. Momose A., Kawamoto S., Koyama I., and Suzuki Y. Phase tomography using an X-ray Talbot interferometer. In: Bonse U. (Ed). Developments in X-ray Tomography IV. Proceedings of SPIE vol. 5535 (2004), SPIE, Bellingham 352-360
5. Weitkamp T., Diaz A., David C., Pfeiffer F., Stampanoni M., Cloetens P., and Ziegler E. X-ray phase imaging with a grating interferometer. Opt. Express 13 (2005) 6296-6304
6. Koyama I., Hamaishi Y., and Momose A. Phase tomography using diffraction-enhanced imaging. In: Warwick T., Arthur J., Padmore H.A., and Stöhr J. (Eds). Eighth International Conference on Synchrotron Radiation Instrumentation. AIP Conference Proceedings vol. 705 (2004), AIP, New York 1283-1286
7. Cloetents P., Ludwig W., Boller E., Helfen L., Salvo L., Mache R., and Schlenker M. Quantitative phase contrast tomography using coherent synchrotron radiation. In: Bonse U. (Ed). Developments in X-ray Tomography III. Proceedings of SPIE vol. 4503 (2002), SPIE, Bellingham 82-91
8. Mayo S.C., Davis T.J., Gureyev T.E., Miller P.R., Paganin D., Pogany A., Stevenson A.W., and Wilkins S.W. X-ray phase-contrast microscopy and microtomography. Opt. Express 11 (2003) 2289-2302
9. McMahon P.J., Peele A.G., Paterson D., Nugent K.A., Snigirev A., Weitkamp T., and Rau C. X-ray tomographic imaging of the complex refractive index. Appl. Phys. Lett. 83 (2003) 1480-1482
10. Peele A.G., De Carlo F., McMahon P.J., Dhal B.B., and Nugent K.A. X-ray phase contrast tomography with a bending magnet source. Rev. Sci. Instrum. 76 (2005) 083707
11. Miao J., Charalambous P., Kirz J., and Sayre D. Extending the methodology of X-ray crystallography to allow imaging of micrometre-sized non-crystalline specimens. Nature 400 (1999) 342-344
12. Morrison G.R. Phase contrast and darkfield imaging in X-ray microscopy. In: Jacobsen C.J., and Trebes J.E. (Eds). Soft X-ray Microscopy. Proceedings of SPIE vol. 1741 (1992), SPIE, Bellingham 186-193
13. Takano H., Uesugi K., Takeuchi A., Takai K., and Suzuki Y. High-sensitive imaging with scanning transmission hard X-ray microscope. J. Phys. IV France 104 (2003) 41-44
14. Kagoshima Y., Shimose K., Koyama T., Wada I., Saikubo A., Hayashi K., Tsusaka Y., and Matsui J. Scanning differential-phase-contrast hard X-ray microscopy with wedge absorber detector. Jpn. J. Appl. Phys. 43 (2004) L1449-L1451
15. Watanabe N., Yokosuka H., Ohigashi T., Takano H., Takeuchi A., Suzuki Y., and Aoki S. Optical holography in the hard X-ray domain. J. Phys. IV France 104 (2003) 551-556
16. Koyama T., Kagoshima Y., Wada I., Saikubo A., Shimose K., Hayashi K., Tsusaka Y., and Matsui J. High-spatial-resolution phase measurement by micro-interferometry using a hard X-ray imaging microscope. Jpn. J. Appl. Phys. 43 (2004) L421-L423
17. Ozawa A., Tamamura T., Ishii T., Yoshihara H., and Kagoshima Y. Application of X-ray mask fabrication technologies to high resolution, large diameter Ta Fresnel zone plates. Microelectron. Eng. 35 (1997) 525-529
18. Kagoshima Y., Yokoyama Y., Ibuki T., Niimi T., Tsusaka Y., Takai K., and Matsui J. High-resolution hard X-ray phase-contrast microscopy with a large-diameter and high-numerical-aperture zone plate. J. Synchrotron Radiat. 9 (2002) 132-135
19. Bruning J.H., Herriott D.R., Gallagher J.E., Rosenfeld D.P., White A.D., and Brangaccio D.J. Digital wavefront measuring interferometer for testing optical surfaces and lenses. Appl. Opt. 13 (1974) 2693-2703
20. Huntley J.M. Noise-immune phase unwrapping algorithm. Appl. Opt. 28 (1989) 3268-3270
21. Tsusaka Y., Yokoyama K., Takeda S., Takai K., Kagoshima Y., and Matsui J. Hyogo beamline at SPring-8: multiple station beamline with the TROIKA concept. Nucl. Instrum. Methods, A 467-468 (2001) 670-673
22. Attwood D. Soft X-rays and Extreme Ultraviolet Radiation: Principles and Applications (1999), Cambridge University Press, Cambridge 303
23. Kagoshima Y., Koyama T., Wada I., Niimi T., Tsusaka Y., Matsui J., Kimura S., Kotera M., and Takai K. A new apparatus for hard X-ray micro-imaging and microdiffraction experiments at BL24XU of SPring-8. In: Warwick T., Arthur J., Padmore H.A., and Stöhr J. (Eds). Eighth International Conference on Synchrotron Radiation Instrumentation. AIP Conference Proceedings vol. 705 (2004), AIP, New York 1263-1266
24. Kinoshita K., Matsumura T., Inagaki Y., Hirai N., Sugiyama M., Kihara H., Watanabe N., and Shimanuki Y. Electronic zooming TV readout system for an X-ray microscope. In: Jacobsen C.J., and Trebes J.E. (Eds). Soft X-ray Microscopy. Proceedings of SPIE vol. 1741 (1992), SPIE, Bellingham 287-293
25. Henke B.L., Gullikson E.M., and Davis J.C. X-ray interactions: photoabsorption, scattering, transmission, and reflection at E = 50-30000 eV, Z = 1-92. At. Data Nucl. Data Tables 54 (1993) 181-342