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Volumn 37, Issue 2, 2004, Pages 231-242

High-throughput powder diffraction. I. A new approach to qualitative and quantitative powder diffraction pattern analysis using full pattern profiles

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; COMPUTER PROGRAM; DECOMPOSITION; PARAMETER; PHASE TRANSITION; POWDER DIFFRACTION; QUALITATIVE ANALYSIS; QUANTITATIVE ANALYSIS; STATISTICAL ANALYSIS;

EID: 3442902490     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S002188980400038X     Document Type: Article
Times cited : (60)

References (40)
  • 7
    • 3442891384 scopus 로고    scopus 로고
    • CCP14 (2003). http://www.ccp14.ac.uk/.
    • (2003)
  • 12
    • 3442897557 scopus 로고    scopus 로고
    • Newton Square, Pennsylvania, USA
    • Gilmore, C. J. (1998). Presented at the ICDD Spring Meeting, Newton Square, Pennsylvania, USA.
    • (1998) ICDD Spring Meeting
    • Gilmore, C.J.1
  • 15
    • 0002958958 scopus 로고
    • edited by R. A. Young. Oxford University Press
    • Hill, R. J. (1993). The Rietveld Method, edited by R. A. Young, pp. 95-101. Oxford University Press.
    • (1993) The Rietveld Method , pp. 95-101
    • Hill, R.J.1
  • 17
    • 0003495856 scopus 로고    scopus 로고
    • International Center for Diffraction Data, 12 Campus Boulevard, Newton Square, Pennsylvania 19073-3273, USA
    • ICDD (2003). The Powder Diffraction File. International Center for Diffraction Data, 12 Campus Boulevard, Newton Square, Pennsylvania 19073-3273, USA.
    • (2003) The Powder Diffraction File
  • 31
    • 3442889563 scopus 로고    scopus 로고
    • edited by R. L. Snyder. J. Fiala & H. J. Bunge. Oxford University Press
    • Smith, D. K. (1999). Defect and Microstrucure Analysis by Diffraction, edited by R. L. Snyder. J. Fiala & H. J. Bunge, pp. 597-610. Oxford University Press.
    • (1999) Defect and Microstrucure Analysis by Diffraction , pp. 597-610
    • Smith, D.K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.