Tailored colloidal AFM probes and their TEM investigation

Surface and Interface Analysis

Volumn 33, Issue 2, 2002, Pages 50-53

  Hüttl, Grit ^a   Klemm, Volker ^a   Popp, Roswitha ^a   Simon, Frank ^b   Müller, Eberhard ^a  

^a TU BERGAKADEMIE FREIBERG   (Germany)

^b LEIBNIZ INSTITUTE OF POLYMER RESEARCH DRESDEN   (Germany)

Author keywords

AFM; Force measurement; Rutile; Silica; TEM; Tip preparation

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHEMICAL MODIFICATION; OXIDATION; PARTICLES (PARTICULATE MATTER); SILICA; SURFACE PROPERTIES; SURFACE ROUGHNESS; SURFACE STRUCTURE; THICKNESS MEASUREMENT; TRANSMISSION ELECTRON MICROSCOPY;

CERAMIC SURFACES; TAILORED COLLOIDAL ATOMIC FORCE MICROSCOPY PROBES;

COLLOIDS;

EID: 0036470970     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/sia.1160     Document Type: Article

References (5)