Modeling absorption of rough interface between dielectric and conductive medium

Microwave and Optical Technology Letters

Volumn 49, Issue 1, 2007, Pages 7-13

  Gu, Xiaoxiong ^a   Tsang, Leung ^a   Braunisch, Henning ^b   Xu, Peng ^c  

^a UNIVERSITY OF WASHINGTON   (United States)

^b INTEL CORPORATION   (United States)

^c WUHAN UNIVERSITY   (China)

Author keywords

Conductors; Perturbation methods; Rough surfaces; T matrix method

Indexed keywords

CONDUCTIVE MEDIUM; NUMERICAL SYSTEM; T-MATRIX METHOD;

CONDUCTIVE MATERIALS; DIELECTRIC MATERIALS; ELECTRIC CONDUCTORS; NUMERICAL METHODS; PERTURBATION TECHNIQUES; PROBLEM SOLVING; SURFACE ROUGHNESS;

INTERFACES (MATERIALS);

EID: 33846014341     PISSN: 08952477     EISSN: None     Source Type: Journal    
DOI: 10.1002/mop.22023     Document Type: Article

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