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Volumn , Issue , 2006, Pages 330-332

ALD growth of Ru on RIE-pretreated TaN substrate

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC LAYER DEPOSITION; CHARACTERIZATION; FILM GROWTH; NUCLEATION; POLYCRYSTALLINE MATERIALS; REACTIVE ION ETCHING; TANTALUM COMPOUNDS;

EID: 34547368029     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICSICT.2006.306220     Document Type: Conference Paper
Times cited : (2)

References (10)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.