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Volumn , Issue , 2006, Pages 330-332
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ALD growth of Ru on RIE-pretreated TaN substrate
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC LAYER DEPOSITION;
CHARACTERIZATION;
FILM GROWTH;
NUCLEATION;
POLYCRYSTALLINE MATERIALS;
REACTIVE ION ETCHING;
TANTALUM COMPOUNDS;
PRECURSORS;
PRETREATMENT;
THERMAL ALD PROCESS;
SUBSTRATES;
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EID: 34547368029
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/ICSICT.2006.306220 Document Type: Conference Paper |
Times cited : (2)
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References (10)
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