High repetition rate and low energy femtosecond laser ablation coupled to ICPMS detection: A new analytical approach for trace element determination in solid samples

Journal of Physics: Conference Series

Volumn 59, Issue 1, 2007, Pages 112-117

  Pecheyran C ^a   Cany, S ^a   Chabassier, P ^b   Mottay, E ^c   Donard, O F X ^a  

^a Laboratoire de Chimie Analytique Bio Inorganique et Environnement UMR 5034   (France)

^b Novalase SA   (France)

^c AMPLITUDE SYSTÈMES   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 34547355646     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/59/1/024     Document Type: Article

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