Deformation corrected real-time terahertz imaging

Applied Physics Letters

Volumn 90, Issue 26, 2007, Pages

  Hattori, Toshiaki ^a   Sakamoto, Masaya ^a  

^a UNIVERSITY OF TSUKUBA   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BIREFRINGENCE; DEFORMATION; ELECTROOPTICAL DEVICES; IMAGE ANALYSIS; REAL TIME CONTROL; TWO DIMENSIONAL;

IMAGE CORRECTION; IMAGE DEFORMATION; TERAHERTZ IMAGING;

IMAGING TECHNIQUES;

EID: 34547351362     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2752543     Document Type: Article

References (25)

1. B. B. Hu and M. C. Nuss, Opt. Lett. 20, 1716 (1995).
2. Q. Wu, T. D. Hewitt, and X.-C. Zhang, Appl. Phys. Lett. 69, 1026 (1996).
3. Z. G. Lu, P. Campbell, and X.-C. Zhang, Appl. Phys. Lett. 71, 593 (1997).
4. Z. Jiang and X.-C. Zhang, Appl. Phys. Lett. 72, 1945 (1998).
5. Z. Jiang and X.-C. Zhang, Opt. Lett. 23, 1114 (1998).
6. Z. Jiang, F. G. Sun, and X.-C. Zhang, Opt. Lett. 24, 1245 (1999).
7. Z. Jiang and X.-C. Zhang, Opt. Express 5, 243 (1999).
8. Z. Jiang and X.-C. Zhang, IEEE Trans. Microwave Theory Tech. 47, 2644 (1999).
9. Z. Jiang, X. G. Xu, and X.-C. Zhang, Appl. Opt. 39, 2982 (2000).
10. M. Usami, T. Iwamoto, R. Fukasawa, M. Tani, M. Watanabe, and K. Sakai, Phys. Med. Biol. 47, 3749 (2002).
11. M. Usami, R. Fukasawa, M. Tani, M. Watanabe, and K. Sakai, Electron. Lett. 39, 1746 (2003).
12. M. Yamashita, M. Usami, K. Fukushima, R. Fukasawa, C. Otani, and K. Kawase, Appl. Opt. 44, 5198 (2005).
13. M. Usami, M. Yamashita, K. Fukushima, C. Otani, and K. Kawase, Appl. Phys. Lett. 86, 141109 (2005).
14. R. Rungsawang, K. Ohta, K. Tukamoto, and T. Hattori, J. Phys. D 36, 229 (2003).
15. T. Hattori, K. Ohta, R. Rungsawang, and K. Tukamoto, J. Phys. D 37, 770 (2004).
16. R. Rungsawang, K. Tukamoto, and T. Hattori, Jpn. J. Appl. Phys., Part 1 44, 1771 (2005).
17. R. Rungsawang, A. Mochiduki, S. Ookuma, and T. Hattori, Jpn. J. Appl. Phys., Part 2 44, L288 (2005).
18. F. Miyamaru, T. Yonera, M. Tani, and M. Hangyo, Jpn. J. Appl. Phys., Part 2 43, L489 (2004).
19. T. Yasuda, T. Yasui, T. Araki, and E. Abraham, Opt. Commun. 267, 128 (2006).
20. J. van Tilborg, C. B. Schroeder, Cs. Tóth, C. G. R. Geddes, E. Esarey, and W. P. Leemans, Opt. Lett. 32, 313 (2007).
21. Z. Jiang, F. G. Sun, Q. Chen, and X.-C. Zhang, Appl. Phys. Lett. 74, 1191 (1999).
22. A. Nahata, A. S. Weling, and T. F. Heinz, Appl. Phys. Lett. 69, 2321 (1996).
23. G. L. Eesley, M. D. Levenson, and W. M. Tolles, IEEE J. Quantum Electron. 14, 45 (1978).
24. M. D. Levenson and G. L. Eesley, Appl. Phys. 19, 1 (1979).
25. D. McMorrow, W. T. Lotshaw, and G. A. Kenney-Wallace, IEEE J. Quantum Electron. 24, 443 (1988).