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Volumn 47, Issue 21, 2002, Pages 3749-3753

Development of a THz spectroscopic imaging system

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED ANALYSIS; DIFFRACTION; ELECTROOPTICAL DEVICES; IMAGING TECHNIQUES; SILICON WAFERS; SPECTROSCOPY;

EID: 0037038495     PISSN: 00319155     EISSN: None     Source Type: Journal    
DOI: 10.1088/0031-9155/47/21/311     Document Type: Article
Times cited : (60)

References (3)
  • 1
    • 21544439607 scopus 로고
    • Imaging with terahertz waves
    • Hu B B and Nuss M C 1995 Imaging with terahertz waves Opt. Lett. 20 1716-8
    • (1995) Opt. Lett , vol.20 , pp. 1716-1718
    • Hu, B.B.1    Nuss, M.C.2
  • 2
    • 0000627616 scopus 로고    scopus 로고
    • Electro-optic sampling near zero optical transmission point
    • Jiang Z, Sun F G, Chen Q and Zhang X-C 1999 Electro-optic sampling near zero optical transmission point Appl. Phys. Lett. 74 1191-3
    • (1999) Appl. Phys. Lett , vol.74 , pp. 1191-1193
    • Jiang, Z.1    Sun, F.G.2    Chen, Q.3    Zhang, X.-C.4
  • 3
    • 0030214773 scopus 로고    scopus 로고
    • Two-dimensional electro-optic imaging of THz beam
    • Wu Q, Hewitt T D and Zhang X-C 1996 Two-dimensional electro-optic imaging of THz beam Appl. Phys. Lett. 69 1026-8
    • (1996) Appl. Phys. Lett , vol.69 , pp. 1026-1028
    • Wu, Q.1    Hewitt, T.D.2    Zhang, X.-C.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.