A fast method for identifying matching-relevant transistor pairs

Proceedings of the Custom Integrated Circuits Conference

Volumn , Issue , 2001, Pages 361-364

  Schenkel, F ^a   Pronath, M ^a   Graeb, H ^a   Antreich, K ^a  

^a TECHNICAL UNIVERSITY OF MUNICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; SENSITIVITY ANALYSIS; THRESHOLD VOLTAGE; TRANSISTORS;

MATCHING RELEVANCY; MISMATCH RELEVANT TRANSISTOR PAIRS; MIXED SIGNAL INTEGRATED CIRCUITS;

INTEGRATED CIRCUIT LAYOUT;

EID: 0034833075     PISSN: 08865930     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)

1. Efficient handling of operating range and manufacturing line variations in analog cell synthesis
2. Characterization and modeling of mismatch in MOS transistors for precision analog design
3. Matching properties of MOS transistors
4. WiCkeD: Analog circuit synthesis incorporating mismatch
5. An asymptotically constant, linearly bounded methodology for the statistical simulation of analog circuits including component mismatch effects