Time-varying multi-stress ALT for modeling life of outdoor optical products

2007 Proceedings - Annual Reliability and Maintainability Symposium, RAMS

Volumn , Issue , 2007, Pages 265-270

  Lam, Chung F ^a   Huairui, Guo ^b   Larson, Lance ^b  

^a Optical Communication   (United States)

^b RELIASOFT CORPORATION   (United States)

Author keywords

Accelerated test; Multi stress; Outdoor environments; Time varying stress

Indexed keywords

ACCELERATED TESTS; GENERALIZED LOG-LINEAR (GLL) LIFE-STRESS; MULTISTRESS; OUTDOOR ENVIRONMENTS; TIME-VARYING STRESSES;

COST BENEFIT ANALYSIS; DESIGN OF EXPERIMENTS; PRODUCT DEVELOPMENT; STRESS ANALYSIS; TEMPERATURE CONTROL; THERMAL EFFECTS;

TIME VARYING SYSTEMS;

EID: 34547327952     PISSN: 0149144X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/RAMS.2007.328125     Document Type: Conference Paper

References (8)

1. A. Mettas, "Modeling & analysis for multiple stress-type accelerated life data." Proceedings, Annual Reliability & Maintainability Symposium, 2000, pp 138-143.
2. P. Nemeth, "Accelerated life time test methods for new package technologies." International Spring Seminar on Electronics Technology, 2001, pp. 215-219.
3. K. Tunga, K. Kacker, et al. "Accelerated thermal cycling: is it different for lead-free solder." Electronic Components and Technology Conference, 2004, pp. 1579-1585.
4. R. Sundararajan, E. Sundararajan, et al. "Multi-stress accelerated aging of polymer housed surge arresters under simulated coastal Florida conditions," IEEE transactions on Dielectrics and Electrical Insulation, vol. 13, no. 1, 2006, pp. 211-226.
5. S. D. Bhakta, and S. Higgins, "Environmental screening and relevant accelerated tests for products in an outdoor ground environment," Proceedings, Annual Reliability & Maintainability Symposium, 2003, pp 309-312.
6. A. Mettas, P. Vassiliou, "Modeling and analysis of time- dependent stress accelerated life data." Proceedings, Annual Reliability & Maintainability Symposium, 2002, pp 343-348.
7. Reliasfot's ALTA, www.weibull.com
8. W. Nelson, Accelerated Testing: Statistical Models, Test Plans, and Data Analysis, New York, John Wiley & Sons, 1990.