Optical restriction of plasma emission light for nanometric sampling depth and depth profiling of multilayered metal samples

Applied Spectroscopy

Volumn 61, Issue 7, 2007, Pages 719-724

  Ctvrtnickova T ^a,b   Fortes, F J ^a   Cabalin L M ^a   Laserna, J J ^a  

^a UNIVERSITY OF MÁLAGA   (Spain)

^b MASARYK UNIVERSITY   (Czech Republic)

Author keywords

Depth profiling; Laser induced breakdown spectrometry; LIBS; Multilayer samples; Optical restriction

Indexed keywords

CHARGE COUPLED DEVICES; DEPTH PROFILING; LASER BEAM EFFECTS; LIGHT EMISSION; MULTILAYERS; OPTICAL VARIABLES CONTROL; SPECTROMETRY;

LASER-INDUCED BREAKDOWN SPECTROMETRY; MULTICHANNEL DETECTORS; MULTILAYER SAMPLES; OPTICAL RESTRICTION;

PLASMA WAVES;

EID: 34547326856     PISSN: 00037028     EISSN: None     Source Type: Journal    
DOI: 10.1366/000370207781393226     Document Type: Article

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