Jitter analysis of general charge sampling amplifiers

Proceedings - IEEE International Symposium on Circuits and Systems

Volumn , Issue , 2006, Pages 5267-5270

  Cenkeramaddi, Linga Reddy ^a   Ytterdal, Trond ^a  

^a NORWEGIAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Norway)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CHARGE; ELECTRIC POTENTIAL; JITTER; MATHEMATICAL MODELS; SIGNAL TO NOISE RATIO;

ANALYTICAL MODELS; CHARGE SAMPLING; VOLTAGE SAMPLING;

AMPLIFIERS (ELECTRONIC);

EID: 34547317852     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)

1. Sami Karvonen, Thomas Riley and Juha Kostamovaara, "On the effects of timing jitter in charge sampling," ISCAS'03, pp. 737-740.
2. Mitsuru Shinagawa, Yukio Akazawa and Tsutomu Wakimoto, "Jitter analysis of high speed sampling systems," IEEE Journal of Solid State Circ., vol. 25, No. 1, February 1990.
3. Gang Xu and Jiren Yuan, "Performance analysis of general charge sampling," IEEE Trans. on Circuits and Systems-II: Express Briefs, Vol. 52, No. 2, pp. 107-111, February 2005.
4. Gang Xu and Jiren Yuan, "Comparison of charge sampling and voltage sampling," MWSCAS-2000.