Performance Analysis of General Charge Sampling

IEEE Transactions on Circuits and Systems II: Express Briefs

Volumn 52, Issue 2, 2005, Pages 107-111

  Xu, Gang ^a   Yuan, Jiren ^a  

^a LUND UNIVERSITY   (Sweden)

Author keywords

Analog circuits; analog digital conversion; charge sampling; jitter; sample and hold circuits; sampling methods; switched circuits; switched system

Indexed keywords

ANALOG TO DIGITAL CONVERSION; ELECTRIC POTENTIAL; JITTER; MATHEMATICAL MODELS; SPURIOUS SIGNAL NOISE; SWITCHING CIRCUITS; SWITCHING SYSTEMS; TRANSFER FUNCTIONS;

CHARGE SAMPLING CIRCUITS; SAMPLE-AND-HOLD CIRCUITS; SAMPLING METHOD; SWITCHED CIRCUITS; SWITCHED SYSTEM;

ELECTRIC NETWORK ANALYSIS;

EID: 14644393091     PISSN: 15497747     EISSN: 15583791     Source Type: Journal    
DOI: 10.1109/TCSII.2004.840479     Document Type: Article

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