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Volumn 78, Issue 6, 2007, Pages
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Development of advanced x-ray imaging crystal spectrometer utilizing a large area segmented proportional counter for KSTAR
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRON TEMPERATURE;
IONS;
PHOTONS;
PROPORTIONAL COUNTERS;
SOFTWARE PROTOTYPING;
TOKAMAK DEVICES;
CURRENT FABRICATION;
IMAGING CRYSTAL SPECTROMETER;
KSTAR;
RADIAL ION;
TOROIDAL PLASMA;
X RAY SPECTROSCOPY;
ARTICLE;
EQUIPMENT;
EQUIPMENT DESIGN;
INSTRUMENTATION;
METHODOLOGY;
RADIATION DOSE;
RADIOMETRY;
REPRODUCIBILITY;
SENSITIVITY AND SPECIFICITY;
SPECTROMETRY;
EQUIPMENT DESIGN;
EQUIPMENT FAILURE ANALYSIS;
RADIATION DOSAGE;
RADIOMETRY;
REPRODUCIBILITY OF RESULTS;
SENSITIVITY AND SPECIFICITY;
SPECTROMETRY, X-RAY EMISSION;
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EID: 34547305788
PISSN: 00346748
EISSN: None
Source Type: Journal
DOI: 10.1063/1.2749441 Document Type: Article |
Times cited : (20)
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References (5)
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